J4 ›› 2013, Vol. 26 ›› Issue (1): 56-59.doi: 10.3976/j.issn.1002-4026.2013.01.012

• Content • Previous Articles     Next Articles

Wavelet analysis and neural network based fault diagnosis for resistive-open defects

 YU Chang-Geng, LAI Li-Ping   

  1. Hezhou University, Hezhou 542800, China
  • Received:2012-08-13 Published:2013-02-20 Online:2013-02-20

PDF (PC)

Like

Abstract:

Resistive-open defects in a digital circuit will cause a time-delay fault and functional failure of a circuit. We address a fault diagnosis method of resistive-open defects with wavelet analysis and neural network based on the analysis of transient power supply current(IDDT) and principal component analysis. Results show that the method is feasible.

Key words: resistive-open defects, transient power supply current(IDDT), wavelet analysis, PCA

CLC Number: 

  • TP3

Open Access This article is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License (CC BY-NC 4.0), which permits third parties to freely share (i.e., copy and redistribute the material in any medium or format) and adapt (i.e., remix, transform, or build upon the material) the articles published in this journal, provided that appropriate credit is given, a link to the license is provided, and any changes made are indicated. The material may not be used for commercial purposes. For details of the CC BY-NC 4.0 license, please visit: https://creativecommons.org/licenses/by-nc/4.0

鲁ICP备10205608号
Website Copyright © Editorial Office of Shandong Science
Tel: 0531-82605310　E-mail: xuxy@qlu.edu.cn
Powered by Beijing Magtech Co. Ltd