Abstract:

Resistive-open defects in a digital circuit will cause a time-delay fault and functional failure of a circuit. We address a fault diagnosis method of resistive-open defects with wavelet analysis and neural network based on the analysis of transient power supply current(IDDT) and principal component analysis. Results show that the method is feasible.

Key words: resistive-open defects, transient power supply current(IDDT), wavelet analysis, PCA