汽车电子产品全寿命电磁兼容测试方法

doi:10.3976/j.issn.1002-4026.2017.02.020

SHANDONG SCIENCE ›› 2017, Vol. 30 ›› Issue (2): 133-138.doi: 10.3976/j.issn.1002-4026.2017.02.020

• Other Research Article • Previous Articles

Whole life-cycle EMC testing method for automotive electronic products

LI Yan-qiang ， ZHANG Xiao-fang

Shandong Provincial Key Laboratoty of Automotive Electronics Technology,Institute of Automation，Shandong Academy of Sciences, Jinan 250014，China

Received:2016-06-02

Abstract

Abstract:

So far much of the EMC testing of automobile electronic products was centered on the new product development stage. An EMC test method of whole life-cycle of automobile electronic products was proposed in this work. The accelerated life testing was carried out by establishing testing model, degradation model and verification model. Results reveal that in the product life span, EMC performance becomes worse with the prolonged time of use, and will exceed the EMC standards limits at some stage, which could have an adverse impact on the electromagnetic compatibility of the vehicle. This work has theoretical and practical significance to improve the reliability, security, and electromagnetic compatibility of automobile electronic products in China.

Key words: automobile electronic, testing model, electromagnetic compatibility, whole life-cycle

CLC Number:

U463.6

LI Yan-qiang,ZHANG Xiao-fang. Whole life-cycle EMC testing method for automotive electronic products[J].SHANDONG SCIENCE, 2017, 30(2): 133-138.

Whole life-cycle EMC testing method for automotive electronic products

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