J4 ›› 2013, Vol. 26 ›› Issue (1): 56-59.doi: 10.3976/j.issn.1002-4026.2013.01.012

• 目录 • 上一篇    下一篇

基于小波-神经网络的电阻性开路故障诊断方法

余长庚, 赖丽萍   

  1. 广西贺州学院 , 广西 贺州 542800
  • 收稿日期:2012-08-13 出版日期:2013-02-20 发布日期:2013-02-20
  • 作者简介:余长庚(1974-),男,博士研究生,讲师,研究方向为现代检测技术。
  • 基金资助:

    贺州学院院级项目(2010ZRKY06,2012PYZK06)

Wavelet analysis and neural network based fault diagnosis for resistive-open defects

 YU Chang-Geng, LAI Li-Ping   

  1. Hezhou University, Hezhou 542800, China
  • Received:2012-08-13 Online:2013-02-20 Published:2013-02-20

摘要:

数字电路中的电阻性开路引起时滞性故障,会使电路的功能失效。针对此故障,本文在分析数字电路的瞬态电流IDDT测试和主成分分析技术的基础上,研究了小波-神经网络诊断电阻性开路故障的方法。结果表明,使用小波-神经网络的数字电路的IDDT方法行之有效。

关键词: 电阻性开路故障, 瞬态电流IDDT, 小波分析, 主成分分析

Abstract:

Resistive-open defects in a digital circuit will cause a time-delay fault and functional failure of a circuit. We address a fault diagnosis method of resistive-open defects with wavelet analysis and neural network based on the analysis of transient power supply current(IDDT) and principal component analysis. Results show that the method is feasible.

Key words: resistive-open defects, transient power supply current(IDDT), wavelet analysis, PCA

中图分类号: 

  • TP3