J4 ›› 2013, Vol. 26 ›› Issue (6): 82-86.doi: 10.3976/j.issn.1002-4026.2013.06.017
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刘建文1,2，张文亮1,2，李朝正1,2，程绍澜1,2，林宪旗2
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LIU Jian-Wen1,2, ZHANG Wen-Liang1,2, LI Chao-Zheng1,2, CHENG Shao-Lan1,2, LIN Xian-Qi2
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摘要：
为校准接触网几何参数测量仪设计了检定台架，由模拟接触线组件和模拟钢轨组件2部分组成，可测量模拟接触线高度和拉出值等接触网关键参数。通过对检定台架相关参数的测量不确定度的评定，表明该检定台架可以校准和检定准确度为1级的测量仪。实际应用证明，该台架结构稳固、性能可靠。
关键词: 检定台架, 接触线高度, 拉出值, 接触网几何参数测量仪
Abstract:
We designed a calibrating rack for calibrating contact wire geometry measuring instrument. It included simulation contact wire component and simulation rail component and could determine such critical parameters as contact wire height and stagger value. Evaluation on measurement uncertainty of related parameters shows that the device can calibrate and adjust a measuring instrument with 1 grade accuracy. Practical application demonstrates that the device is stable and reliable.
Key words: calibrating rack, contact wire height, stagger value, measuring instrument for contact wire geometry
中图分类号:
U225
刘建文，张文亮，李朝正，程绍澜，林宪旗. 接触网几何参数测量仪检定台架的设计[J]. J4, 2013, 26(6): 82-86.
LIU Jian-Wen, ZHANG Wen-Liang, LI Chao-Zheng, CHENG Shao-Lan, LIN Xian-Qi. Design of the calibrating rack of a measuring instrument for contact wire geometry[J]. J4, 2013, 26(6): 82-86.
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https://www.sdkx.net/CN/Y2013/V26/I6/82
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